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Kogawa, Hiroyuki; Futakawa, Masatoshi; Ishikura, Shuichi*; Kikuchi, Kenji; Hino, Ryutaro; Eto, Motokuni
International Journal of Impact Engineering, 25(1), p.17 - 28, 2001/01
Times Cited Count:3 Percentile:23.89(Engineering, Mechanical)no abstracts in English
Hatae, Takaki; Naito, Osamu
Proceedings of 10th International Symposium on Laser-Aided Plasma Diagnostics, p.160 - 166, 2001/00
In recent strong electron heating experiments in JT-60U, it seems that central rises above 15 keV which is measured by Ruby laser and YAG laser Thomson scattering systems. However, error bars are relatively large and it is difficult to measure the very high beyond 15 keV with high accuracy because the electron temperature region exceeds that of the original design. To improve the measurement performance in very high , we have tried the combination of existing Ruby laser system and YAG laser system. From simulations, it was found that (1) changing the form of the spectrum with the other laser is an effective way for very high measurement, (2) furthermore the combined system in YAG laser scattering is well optimized at 20keV and relative error is reduced significantly compared with original system.
Hatae, Takaki; Yoshida, Hidetoshi; Yamauchi, Toshihiko; Naito, Osamu
Purazuma, Kaku Yugo Gakkai-Shi, 76(9), p.868 - 873, 2000/09
no abstracts in English
Yoshida, Hidetoshi; Naito, Osamu; Yamashita, Osamu; Kitamura, Shigeru; *; *; *; *; Hatae, Takaki; Nagashima, Akira; et al.
Review of Scientific Instruments, 70(1), p.751 - 754, 1999/01
Times Cited Count:15 Percentile:68.21(Instruments & Instrumentation)no abstracts in English
Yoshida, Hidetoshi; Naito, Osamu; *; Kitamura, Shigeru; Hatae, Takaki; Nagashima, Akira
Review of Scientific Instruments, 70(1), p.747 - 750, 1999/01
Times Cited Count:4 Percentile:38.4(Instruments & Instrumentation)no abstracts in English
Yoshida, Hidetoshi; Naito, Osamu; Matoba, Toru; Yamashita, Osamu; Kitamura, Shigeru; Hatae, Takaki; Nagashima, Akira
Review of Scientific Instruments, 68(2), p.1152 - 1161, 1997/02
Times Cited Count:13 Percentile:68.1(Instruments & Instrumentation)no abstracts in English
Yoshida, Hidetoshi; Naito, Osamu; Yamashita, Osamu; Kitamura, Shigeru; Nagashima, Akira; Matoba, Toru
Review of Scientific Instruments, 66(1), p.143 - 147, 1995/01
Times Cited Count:24 Percentile:84.17(Instruments & Instrumentation)no abstracts in English
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Japanese Journal of Applied Physics, 18(3), p.611 - 619, 1979/00
Times Cited Count:3no abstracts in English